Artificial intelligence

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Аналіз властивостей наноповерхностей за ACM зображенням

Nedzved A.1, Ablameyko S.1, Nedzved O.1
1 United Institute of Informatics Problems of the NAS of Belarus,

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UDC: 004.93'1;004.932
Publication Language: Russian
Stuc. intelekt. 2011; 16(3):246-253

Abstract: In this paper the scheme of algorithm of nano-surface image analysis of atomic force microscopy was described. The analysis is based on correction of uneven contrast and object selection with a rounded shape. This algorithm allowed us to determine not only the classical characteristics of nano-surface such as roughness, but it included additional characteristics of several nano-objects.

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