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Оцінка параметрів розподілу дефектів ІС з допомогою завадостійкої кластеризації
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UDC: 621.382
Publication Language: Russian
Stuc. intelekt. 2009; 14(3):449-455
Abstract: The IC defect distribution parameters evaluation with noise stability clustering was carryied out. The IC medium clustering defect distribution’s block size evaluation method and its implementation procedure was proposed. In that procedure multi starting sub gradient iterative clustering method is used. The experimental investigation for this clustering method noise immunity increasing and own error decreasing estimation was carried out.
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